An Enhanced Single-Event Charge Cancellation Technique for Sensitive Circuit Nodes
Vibbert, Daniel Scott
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2018-08-27
Abstract
An enhancement to an existing radiation hardening by design (RHBD) technique is proposed. The technique, Sensitive Node Active Charge Cancellation (SNACC), protects sensitive A/MS circuit nodes against single-event transients by leveraging inherent charge sharing effects to provide cancellation of deposited charge. By analyzing the charge sharing effects that drive the SNACC technique, a new technique, Enhanced SNACC (ESNACC), is derived that affords the same protection of sensitive nodes but with less sensitive area penalty. Single-event transient simulation results of a bias circuit hardened with ESNACC are presented to demonstrate the ESNACC concept.