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Title page for ETD etd-12062011-113559

Type of Document Master's Thesis
Author Mahatme, Nihaar Nilesh
Author's Email Address nihaar.n.mahatme@vanderbilt.edu
URN etd-12062011-113559
Title Comparison of combinational and sequential error rates and a low overhead technique for single event transient mitigation
Degree Master of Science
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Bharat Bhuva Committee Chair
Lloyd Massengill Committee Member
  • combinational logic circuits
  • high speed circuits
  • radiation effects
  • single event effects
  • soft errors
Date of Defense 2011-11-30
Availability unrestricted
Single Event Effects (SEE) in combinational logic circuits, caused due radiation particle strikes are a major concern for modern high-speed devices. The frequency dependence of SEE in state-of-the-art 40 nm circuits is evaluated and the contribution of logic errors to the chip-level Soft Error Rate (SER) is quantified experimentally. A model is developed to help predict the frequency threshold at which logic errors could dominate the chip-level SER. Results suggest that, due to higher transistor density and higher operating frequencies, logic soft errors could exceed the flip-flop error rate for future technologies. A low overhead probabilistic technique to harden logic circuits against radiation induced errors is also developed.
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