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Title page for ETD etd-08152018-130817


Type of Document Master's Thesis
Author Vibbert, Daniel Scott
Author's Email Address daniel.s.vibbert@vanderbilt.edu
URN etd-08152018-130817
Title An Enhanced Single-Event Charge Cancellation Technique for Sensitive Circuit Nodes
Degree Master of Science
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Jeffrey Scott Kauppila Committee Member
William Timothy Holman, Ph. D. Committee Member
Keywords
  • single-event hardening
  • single-event transients
  • single-event effects
  • radiation hardening by design
Date of Defense 2018-05-24
Availability unrestricted
Abstract
An enhancement to an existing radiation hardening by design (RHBD) technique is proposed. The technique, Sensitive Node Active Charge Cancellation (SNACC), protects sensitive A/MS circuit nodes against single-event transients by leveraging inherent charge sharing effects to provide cancellation of deposited charge. By analyzing the charge sharing effects that drive the SNACC technique, a new technique, Enhanced SNACC (ESNACC), is derived that affords the same protection of sensitive nodes but with less sensitive area penalty. Single-event transient simulation results of a bias circuit hardened with ESNACC are presented to demonstrate the ESNACC concept.
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