A joint project of the Graduate School, Peabody College, and the Jean & Alexander Heard Library

Title page for ETD etd-07132009-181624

Type of Document Master's Thesis
Author Jagannathan, Srikanth
Author's Email Address srikanth.jagannathan@vanderbilt.edu
URN etd-07132009-181624
Title Portable Behavioral Modeling of TID Degradation of Voltage Feedback Op-Amps
Degree Master of Science
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Dr. Lloyd W. Massengill Committee Member
Dr. W. Timothy. Holman Committee Member
  • Behavioral modeling
  • TID
  • macro model
  • LM124
  • op amp
Date of Defense 2009-07-02
Availability unrestricted
Presently the tools available for predicting the effect of radiation on microelectronic circuits rely on SPICE models to simulate post-irradiation parameter and performance changes. However, modeling complex integrated circuits with SPICE simulations requires large amounts of engineering and computer simulation time. Also, repetitive simulations are needed with SPICE to simulate the evolution of degradation in the circuit parameters with total dose.

Behavioral modeling technique provides an excellent alternative. Simplified behavioral models of a circuit or a sub-circuit could replace the SPICE-based circuits. The behavioral models describe the electrical circuit behavior and its dependence on the radiation dose with a high degree of accuracy. A single continuous simulation could ideally cover the entire circuit response from normal electrical operation (pre-irradiation or pre-rad) to post-irradiation performance at different exposure levels to assess system failure or to qualify radiation tolerance.

This thesis describes a generic modeling technique to create TID aware behavioral models of voltage feedback op-amps without creation of underlying SPICE micro-model. The op amp behaviors dependence on supply voltage, input voltage and total dose are captured in the model. The model accurately predicts TID response of board-level designs without expensive fabrication runs. The behavioral model runs at least 79 times faster than SPICE in the case of Schmitt trigger oscillator circuit while maintaining accuracy to within 5% of SPICE values.

  Filename       Size       Approximate Download Time (Hours:Minutes:Seconds) 
 28.8 Modem   56K Modem   ISDN (64 Kb)   ISDN (128 Kb)   Higher-speed Access 
  Srikanth_Jagannathan_MastersThesis.pdf 842.37 Kb 00:03:53 00:02:00 00:01:45 00:00:52 00:00:04

Browse All Available ETDs by ( Author | Department )

If you have more questions or technical problems, please Contact LITS.