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Title page for ETD etd-03292010-113506

Type of Document Master's Thesis
Author Atkinson, Nicholas Montgomery
URN etd-03292010-113506
Title Single-Event Characterization of a 90-nm Bulk CMOS Digital Cell Library
Degree Master of Science
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Prof. W. Timothy Holman Committee Chair
Prof. Arthur F. Witulski Committee Member
  • cell library
  • single event
Date of Defense 2010-03-17
Availability unrestricted
A single event occurs when an ionizing particle strikes a microelectronic circuit and deposits charge in the semiconductor material. Charge deposited by the particle is often collected by the circuit, resulting in a current transient that can lead to soft errors, depending on the circuit response. In this thesis, single-event (SE) mechanisms in combinational logic are discussed in the context of a 90-nm digital cell library in bulk CMOS. Technology Computer Aided Design (TCAD) simulations are used to investigate various parameters across different cell designs. Knowledge of the effects of layout- and circuit-level parameters on SE response is used to perform a TCAD characterization of a 90-nm digital cell library. The results give insight into the relative SE vulnerability of different types of logic cells.
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