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Title page for ETD etd-12102010-152348


Type of Document Dissertation
Author Olson, Brian David
URN etd-12102010-152348
Title Single-Event Effect Mitigation in Pipelined Analog-to-Digital Converters
Degree PhD
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Lloyd W. Massengill Committee Chair
Arthur F. Witulski Committee Member
Bharat L. Bhuva Committee Member
Dale McMorrow Committee Member
W. Timothy Holman Committee Member
Keywords
  • single-events
  • SEU
  • SEE
  • RHBD
  • radiation hardened by design
  • ADC
  • single-event effects
  • analog-to-digital converters
Date of Defense 2010-09-03
Availability unrestricted
Abstract
Analog-to-digital converters (ADCs) are necessary circuits in many space, military, and medical circuit applications. Intelligence, surveillance, reconnaissance, and communication missions all require high performance ADCs. Speed, resolution, and power are concerns in high performance designs. Unlike commercial applications, space, military, and some medical electronics must also be able to function in a radiation environment. This additional complexity provides an interesting and needed area of research.

The goal of this work is to understand single event effects (SEEs) in high-speed ADCs, so the impact of design topologies and mitigation techniques can be evaluated for Department of Defense (DOD) or commercial space deployment. This goal is broken into two parts. The first part characterizes and explains the single event effect response, and presents a novel method of evaluating SEEs in ADCs through the use of frequency domain analysis. The second part provides additional circuit design alternatives for hardening pipelined ADCs: the use of comparator triple modular redundancy or robust encoder logic in the front pipeline stages, dual-path hardening in switched-capacitor sub-circuits, and applying analog layout techniques to all transistors-pairs along the fully-differential signal path. The conclusion of this work helps designers achieve ADCs for the next generation applications, influence experimental testing methodologies, and applies to other high-speed mixed signal applications.

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