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Title page for ETD etd-12092011-021148


Type of Document Dissertation
Author Armstrong, Sarah E.
URN etd-12092011-021148
Title Single-Event Characterization and Mitigation in High-Speed CMOS Communications Devices
Degree PhD
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Lloyd Massengill Committee Chair
Michael L. Alles Committee Member
Robert Reed Committee Member
Stephen Buchner Committee Member
W. Timothy Holman Committee Member
Keywords
  • Communications Devices
  • Radiation Hardening by Design
  • Single-Event Effects
Date of Defense 2011-11-18
Availability unrestricted
Abstract
High-speed communication systems employ a mix of signal types and circuit topologies in order to optimize efficient data propagation. Typical serializer-deserializer (SerDes) circuits include three major sections, the transmitter, receiver, and lane. The propagating data is controlled by two global signals: bias and clock circuitry. The interfaces between the global signals and between signal domains expose the device to potential single-event (SE) vulnerability. The interfaces cannot be eliminated without sacrificing circuit performance.

Traditional and recently developed analog radiation-hardening-by-design (RHBD) techniques are applied to the SE vulnerable interfaces as well as current mode logic (CML) and bias circuits in order to develop guidelines for future SE hardened designs that maximize circuit hardening and minimize power, speed, and area penalties.

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