Type of Document	Dissertation
Author	Armstrong, Sarah E.
URN	etd-12092011-021148
Title	Single-Event Characterization and Mitigation in High-Speed CMOS Communications Devices
Degree	PhD
Department	Electrical Engineering
Advisory Committee	Advisor Name Title Lloyd Massengill Committee Chair Michael L. Alles Committee Member Robert Reed Committee Member Stephen Buchner Committee Member W. Timothy Holman Committee Member
Keywords	Communications Devices Radiation Hardening by Design Single-Event Effects
Date of Defense	2011-11-18
Availability	unrestricted
Abstract High-speed communication systems employ a mix of signal types and circuit topologies in order to optimize efficient data propagation. Typical serializer-deserializer (SerDes) circuits include three major sections, the transmitter, receiver, and lane. The propagating data is controlled by two global signals: bias and clock circuitry. The interfaces between the global signals and between signal domains expose the device to potential single-event (SE) vulnerability. The interfaces cannot be eliminated without sacrificing circuit performance. Traditional and recently developed analog radiation-hardening-by-design (RHBD) techniques are applied to the SE vulnerable interfaces as well as current mode logic (CML) and bias circuits in order to develop guidelines for future SE hardened designs that maximize circuit hardening and minimize power, speed, and area penalties.
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