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Title page for ETD etd-12012011-134348


Type of Document Dissertation
Author Sierawski, Brian David
Author's Email Address brian.sierawski@vanderbilt.edu
URN etd-12012011-134348
Title The Role of Singly-Charged Particles in Microelectronics Reliability
Degree PhD
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Ronald D. Schrimpf Committee Chair
Robert A. Reed Committee Co-Chair
James H. Adams Committee Member
Marcus H. Mendenhall Committee Member
Robert A. Weller Committee Member
Keywords
  • proton
  • muon
  • direct ionization
  • single event upset
  • soft error
  • memory
Date of Defense 2011-11-17
Availability unrestricted
Abstract
Lightly ionizing particles in any radiation environment have the potential to induce single event upsets in scaled CMOS technologies. As microelectronic devices become smaller and require less charge to hold state, they inherently become more sensitive to ionizing radiation. In two test campaigns, single event upsets due to protons and muons, both singly-charged and therefore lightly ionizing, are experimentally demonstrated. The sources of errors in the terrestrial environment, commonly thought to be dominated by neutron-induced events, are shown through simulation to include ionization from muons. Similarly, errors in proton rich extra-terrestrial environments may be dominated by proton ionization rather than spallation. The consequences of such a high sensitivity are significant for memory elements where error detection and correction are costly and therefore require characterizations of the failure rates. In this dissertation, the radiation environments and energy deposition processes of charged particles are explored and the potential for upsets due to direct ionization from singly-charged particles is established. Experimental methods complemented with computational models of radiation transport test this hypothesis. Further, modeling of the natural environments predict the contribution of singly-charged particles to field fails.
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