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Title page for ETD etd-11242015-013303


Type of Document Dissertation
Author Assis, Thiago Rocha de
Author's Email Address thiago.r.assis@vanderbilt.edu
URN etd-11242015-013303
Title Soft error aware physical synthesis
Degree PhD
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Dr. Bharat L. Bhuva Committee Chair
Dr. Aniruddha S. Gokhale Committee Member
Dr. Ronald D. Schrimpf Committee Member
Dr. Shi-Jie Wen Committee Member
Dr. William H. Robinson Committee Member
Keywords
  • single event transient
  • set pulse width
  • collected charge
  • radiation effects
  • electronic design automation
  • physical synthesis
  • soft error
  • reliability
Date of Defense 2015-11-11
Availability unrestricted
Abstract
To allow accurate analysis of Soft Errors by Electronic Design Automation (EDA) tools, analytical models were developed to estimate electrical characteristics of the single event. The Ambipolar-Diffusion-With-Cutoff (ADC) model was extended in this work to model charge sharing, thus allowing accurate charge estimation by EDA tools An Single Event Transient (SET) pulse width estimation methodology was developed to model the Standard Cells response to the soft error. Combining these models along with circuit masking probabilities, the circuit soft-error cross-section is estimated. These soft error models are then integrated into an automatic standard cell placement tool based on Quadratic Optimization. Results show the impact of Physical Synthesis electrical correction techniques, such as Buffering, Gate Cloning and Gate Sizing, to the circuit soft error cross-section. Furthermore, an algorithm to reduce the circuit soft error cross-section by optimizing the Tap Cell placement was also developed and demonstrated. Results from this thesis provide key insights to control the circuit soft error cross-section during the Physical Synthesis design flow for integrated circuits at the most advanced technology nodes.
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