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Title page for ETD etd-07302014-151719


Type of Document Master's Thesis
Author Voytek, Patrick Clay
URN etd-07302014-151719
Title Gamma total ionizing dose impact on the control performance of integrated point-of-load converters
Degree Master of Science
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Dr. Arthur F. Witulski Committee Chair
Dr. Robert A. Reed Committee Member
Keywords
  • integrated converter
  • POL converter
  • buck converter
  • DC/DC converter
  • loop gain
  • TID
  • switching converter
Date of Defense 2014-07-25
Availability unrestricted
Abstract
The growing demand for commercial off the shelf (COTS) electronic components in radiation

environments has driven the need for researching the total ionizing dose (TID) degradation of these components.

Most relevant systems require regulated DC voltages, often supplied by DC/DC switching converters. As

technology scales, desired converters are increasingly integrated onto a single die. As the power regulation circuitry

of these switching converters has become more compact, the ability to perform measurements on them has become

more difficult. Additionally, although the TID response of small-signal parameters for linear regulators – another

type of DC/DC converter – has been examined, previous work on the response of switching converters has focused

only on large-signal parametric shifts of converters built from discrete components. Small-signal parameters, such as

the loop gain, provide valuable information about the stability and disturbance response of a feedback circuit, such

as a DC/DC converter. This work examines the effects of TID on both large- and small-signal parameters of an

integrated, COTS, buck converter, a common type of switching converter, and it addresses the challenges of

performing loop gain measurements on an integrated chip. It is shown that the tested converter is surprisingly

radiation tolerant to moderate dose, experiencing only minor shifts in the loop gain which correspond to minor shifts

in the output voltage; however, it is prone to complete failure at a dose of tens of krads (Si). It is also shown that

variations in the turn-on voltage do not follow a clear trend.

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