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Title page for ETD etd-05312006-163349

Type of Document Master's Thesis
Author Mahajan, Sameer Vinayak
URN etd-05312006-163349
Title Electro-thermal simulation studies of single-event burnout in power diodes
Degree Master of Science
Department Interdisciplinary Materials Science
Advisory Committee
Advisor Name Title
Professor D. Greg Walker Committee Chair
Professor Ronald D. Schrimpf Committee Member
  • power diodes
  • Diodes Semiconductor -- Computer simulation
  • Semiconductors -- Effect of radiation on
  • electro-thermal simulations
  • single-event burnout
Date of Defense 2006-05-24
Availability unrestricted
Single-event burnout in power diodes is studied using coupled electro-thermal simulations. A two-dimensional rectangular diode structure is designed and steady-state electrical characteristics are simulated. Single-event effects are simulated using an ion-strike modeled after data reported in the literature and transient characteristics are simulated following the strike. Ion-strike simulations are performed under isothermal conditions to study temperature-dependent device properties. Coupled electro-thermal simulations are performed to study a thermal feedback loop as a possible failure mechanism. Single-event burnout is not observed for the power diode and a thermal feedback loop is not identified. Highly localized temperature rise near pn junction is observed along the strike direction. Impact-ionization induced charge is responsible for local power generation that leads to this temperature rise. Further, two-dimensional axi-symmetric or 3D simulations could provide more incite into single-event burnout of power diodes.
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