Type of Document	Master's Thesis
Author	Mahajan, Sameer Vinayak
URN	etd-05312006-163349
Title	ELECTRO-THERMAL SIMULATION STUDIES OF SINGLE-EVENT BURNOUT IN POWER DIODES
Degree	Master of Science
Department	Interdisciplinary Materials Science
Advisory Committee	Advisor Name Title Professor D. Greg Walker Committee Chair Professor Ronald D. Schrimpf Committee Member
Keywords	Semiconductors -- Effect of radiation on Diodes Semiconductor -- Computer simulation power diodes electro-thermal simulations single-event burnout
Date of Defense	2006-05-24
Availability	unrestricted
Abstract Single-event burnout in power diodes is studied using coupled electro-thermal simulations. A two-dimensional rectangular diode structure is designed and steady-state electrical characteristics are simulated. Single-event effects are simulated using an ion-strike modeled after data reported in the literature and transient characteristics are simulated following the strike. Ion-strike simulations are performed under isothermal conditions to study temperature-dependent device properties. Coupled electro-thermal simulations are performed to study a thermal feedback loop as a possible failure mechanism. Single-event burnout is not observed for the power diode and a thermal feedback loop is not identified. Highly localized temperature rise near pn junction is observed along the strike direction. Impact-ionization induced charge is responsible for local power generation that leads to this temperature rise. Further, two-dimensional axi-symmetric or 3D simulations could provide more incite into single-event burnout of power diodes.
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