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Title page for ETD etd-05312006-163349


Type of Document Master's Thesis
Author Mahajan, Sameer Vinayak
URN etd-05312006-163349
Title Electro-thermal simulation studies of single-event burnout in power diodes
Degree Master of Science
Department Interdisciplinary Materials Science
Advisory Committee
Advisor Name Title
Professor D. Greg Walker Committee Chair
Professor Ronald D. Schrimpf Committee Member
Keywords
  • power diodes
  • Diodes Semiconductor -- Computer simulation
  • Semiconductors -- Effect of radiation on
  • electro-thermal simulations
  • single-event burnout
Date of Defense 2006-05-24
Availability unrestricted
Abstract
Single-event burnout in power diodes is studied using coupled electro-thermal simulations. A two-dimensional rectangular diode structure is designed and steady-state electrical characteristics are simulated. Single-event effects are simulated using an ion-strike modeled after data reported in the literature and transient characteristics are simulated following the strike. Ion-strike simulations are performed under isothermal conditions to study temperature-dependent device properties. Coupled electro-thermal simulations are performed to study a thermal feedback loop as a possible failure mechanism. Single-event burnout is not observed for the power diode and a thermal feedback loop is not identified. Highly localized temperature rise near pn junction is observed along the strike direction. Impact-ionization induced charge is responsible for local power generation that leads to this temperature rise. Further, two-dimensional axi-symmetric or 3D simulations could provide more incite into single-event burnout of power diodes.
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