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Title page for ETD etd-04022008-133031


Type of Document Master's Thesis
Author Holt, Christopher
URN etd-04022008-133031
Title Analysis of single event transients in dynamic logic circuitry
Degree Master of Science
Department Electrical Engineering
Advisory Committee
Advisor Name Title
W. Timothy Holman Committee Chair
Bharat L. Bhuva Committee Co-Chair
Keywords
  • Logic circuits -- Testing
  • SETs
  • Dynamic logic
  • single event transients
  • Integrated circuits -- Effect of radiation on
Date of Defense 2007-12-17
Availability unrestricted
Abstract
Dynamic logic circuitry is generally faster and smaller than equivalent static logic circuits. The use of these circuits in space is desirable, but not much work has been performed in assessing their vulnerability to the ionizing particles present in the space environment. These particles can generate transient currents that can affect circuit performance. The effects of single event transients on dynamic logic circuitry are studied. Simulations are performed using the IBM 130nm and 90nm processes. Mechanisms of upset are determined for both precharge and evaluate phases of dynamic logic. Frequency effects, stage length dependency, keeper effects, and LET effects are all considered. An analysis by hit nodes on a dynamic full adder circuit is performed at varying frequencies. Results are compared with equivalent static logic circuits.
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