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Title page for ETD etd-03262017-152441


Type of Document Master's Thesis
Author Qiu, Hao
URN etd-03262017-152441
Title Cross-Layered Reliability Analysis of Object-Tracking Algorithms to Radiation-Induced Soft Errors
Degree Master of Science
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Richard A. Peters Committee Member
William H. Robinson Committee Member
Keywords
  • object-tracking
  • Radiation-induced faults
  • cross-layered reliability analysis
  • field-programmable gate arrays
  • soft errors
Date of Defense 2016-12-15
Availability unrestricted
Abstract
Hardware implementations of Object-Tracking Algorithms are susceptible to radiation-induced soft errors. The thesis analyzes the results of fault emulation experiments conducted on register-transfer level on a field-programmable gate array (FPGA) implementation of object tracking. Typical single event effect (SEE) induced faults were injected to core modules within the object tracking system. The results indicate that injected faults can cause observable errors in tracking system outputs, which are defined as values exceeding a selected threshold. The level of degradation is related to the fault injection location as well as the type of faults. Under the worst-case experiments, the output error rate was more than 88%. The cross-layered reliability analysis between circuit and algorithm is significant to algorithms optimization and selective circuit hardening.
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